Title :
Lateral field enhanced band-trap-band tunneling current in a 0.5μm "OFF" state MOSFET
Author :
Wang, Tahui ; Huang, C. ; Chang, T.E. ; Chou, J.W. ; Chang, C.Y.
Author_Institution :
National Chiao-Tung University
fDate :
6/16/1905 12:00:00 AM
Keywords :
Charge carrier processes; Current measurement; Electron traps; Hot carriers; Leakage current; MOSFET circuits; Steady-state; Stress measurement; Tellurium; Tunneling;
Conference_Titel :
Device Research Conference, 1994. 52nd Annual
DOI :
10.1109/DRC.1994.1009422
