DocumentCode
1721887
Title
Scaling studies of hot electron injection and interface-state generation in deep-submicron silicon mosfets: a monte carlo analysis
Author
Ellis-Monaghan, J.J. ; Hulfachor, R.B. ; Kim, K.W. ; Littlejohn, M.A.
Author_Institution
North Carolina State University
fYear
1994
fDate
6/16/1905 12:00:00 AM
Firstpage
81
Lastpage
82
Keywords
Ice; Interface states; MOSFETs; Microelectronics; Monte Carlo methods; Power generation; Probability distribution; Secondary generated hot electron injection; Silicon; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 1994. 52nd Annual
Type
conf
DOI
10.1109/DRC.1994.1009424
Filename
1009424
Link To Document