DocumentCode
1721908
Title
On the second order power spectral statistics of wideband indoor microwave channels
Author
Derpich, Milan S. ; Feick, Rodolfo
Author_Institution
Univ. Tec. Federico Santa Maria, Valparaíso, Chile
fYear
2010
Firstpage
335
Lastpage
340
Abstract
We derive closed form expressions for the second-order statistics of the spectral power gain of wide-band microwave indoor channels. We obtain our results within a framework general enough to be compatible with several popular channel models, such as those proposed by the IEEE 802.15.3a task group, as well as the Saleh-Valenzuela channel model. As all these models, our channel description is based upon clusters and rays with Poisson arrivals and random amplitudes. Our results consist of closed form expressions for the second-order statistics of the channel power frequency response, where statistical averages involve expectations over ray amplitudes and arrival times. We first express the auto-covariance of this frequency response in closed-form. We then use this result to obtain an analytical expression for the variance and second-order moment of the channel power within any given interval of frequencies. This allows us to express the channel spectral diversity as a function of model parameters and bandwidth. From this function, we determine the range within which diversity scales approximately linearly with bandwidth and its upper limit.
Keywords
frequency response; higher order statistics; indoor radio; stochastic processes; wireless channels; IEEE 802.15.3a task group; Poisson arrivals; Saleh-Valenzuela channel model; channel power frequency response; channel spectral diversity; closed form expressions; random amplitudes; second order power spectral statistics; second-order moment; spectral power gain; wideband indoor microwave channels; Bandwidth; Channel models; Correlation; Delay; Frequency response; Random variables; Wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
Personal Indoor and Mobile Radio Communications (PIMRC), 2010 IEEE 21st International Symposium on
Conference_Location
Instanbul
Print_ISBN
978-1-4244-8017-3
Type
conf
DOI
10.1109/PIMRC.2010.5671854
Filename
5671854
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