Title :
A DC voltage capacitance matching tester
Author :
McNeill, Bruce W. ; Hanle, Chris
Author_Institution :
AT&T Bell Labs., Allentown, PA, USA
Abstract :
We developed a self-contained capacitor matching tester that requires only the application and measurement of DC voltages. The test circuit includes its own oscillator, a nonoverlapping clock generator, and a second-order active lowpass filter. Our measurement accuracy is about 0.005% 3-sigma, and the tester is 1000 microns high by 300 microns wide
Keywords :
capacitance measurement; capacitors; electron device testing; test equipment; voltage measurement; DC voltage measurement; nonoverlapping clock generator; oscillator; second-order active lowpass filter; self-contained capacitor matching tester; test circuit; Automatic testing; Capacitance; Capacitors; Circuit noise; Circuit testing; Filters; Frequency; Operational amplifiers; Oscillators; Voltage;
Conference_Titel :
Microelectronic Test Structures, 1997. ICMTS 1997. Proceedings. IEEE International Conference on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-3243-1
DOI :
10.1109/ICMTS.1997.589394
