Title :
Simultaneous cryogenic temperature (77 K) and total dose ionizing radiation effects on COTS amplifiers
Author :
Guckenberger, Drew ; Hiemstra, David M.
Author_Institution :
Waterloo Univ., Ont., Canada
fDate :
6/23/1905 12:00:00 AM
Abstract :
COTS CMOS and bipolar amplifiers were subjected to gamma radiation at room temperature and 77 K to observe the relationship between cryogenic temperature and ionizing radiation effects. Frequency response, THD and noise voltage results are presented
Keywords :
CMOS analogue integrated circuits; bipolar analogue integrated circuits; cryogenic electronics; frequency response; gamma-ray effects; harmonic distortion; instrumentation amplifiers; integrated circuit noise; integrated circuit testing; operational amplifiers; 293 K; 77 K; AD620 bipolar instrumentation amplifier; CLC425 bipolar op amp; CMOS amplifiers; COTS amplifiers; LMC6061 CMOS op amp; THD; TLV2770 CMOS op amp; bipolar amplifiers; commercial off-the-shelf devices; cryogenic temperature effects; frequency response; gamma radiation; ionizing radiation effects; noise voltage; opamps; room temperature; CMOS technology; Cryogenics; Distortion measurement; Frequency response; Gamma rays; Ionizing radiation; Space technology; Temperature; Testing; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2001 IEEE
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-7199-2
DOI :
10.1109/REDW.2001.960442
