Simultaneous cryogenic temperature (77 K) and total dose ionizing radiation effects on COTS amplifiers

Author

Guckenberger, Drew ; Hiemstra, David M.

Author_Institution

Waterloo Univ., Ont., Canada

fYear

2001

fDate

6/23/1905 12:00:00 AM

Firstpage

14

Lastpage

18

Abstract

COTS CMOS and bipolar amplifiers were subjected to gamma radiation at room temperature and 77 K to observe the relationship between cryogenic temperature and ionizing radiation effects. Frequency response, THD and noise voltage results are presented

Keywords

CMOS analogue integrated circuits; bipolar analogue integrated circuits; cryogenic electronics; frequency response; gamma-ray effects; harmonic distortion; instrumentation amplifiers; integrated circuit noise; integrated circuit testing; operational amplifiers; 293 K; 77 K; AD620 bipolar instrumentation amplifier; CLC425 bipolar op amp; CMOS amplifiers; COTS amplifiers; LMC6061 CMOS op amp; THD; TLV2770 CMOS op amp; bipolar amplifiers; commercial off-the-shelf devices; cryogenic temperature effects; frequency response; gamma radiation; ionizing radiation effects; noise voltage; opamps; room temperature; CMOS technology; Cryogenics; Distortion measurement; Frequency response; Gamma rays; Ionizing radiation; Space technology; Temperature; Testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 2001 IEEE

Conference_Location

Vancouver, BC

Print_ISBN

0-7803-7199-2

Type

conf

DOI

10.1109/REDW.2001.960442

Filename

960442