Title :
Comparative testing of ADSP-21020 digital signal processors from multiple vendors
Author :
Duggan, Paul ; Sampson, Steven ; Burnell, Richard ; Koga, Rocky ; Yu, Paul ; Crain, Susan ; McEndree, Steve ; Tausch, Jake ; Sleeter, Dave ; Alexander, Dave
Author_Institution :
U. S. Air Force Res. Lab., Kirtland AFB, NM, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
Total ionizing dose, ionizing dose rate, and single event effects test results are reported on the ADSP-21020 by Analog Devices Inc., the RH21020 by BAE Systenis/Manassas, and the TSC21020F by Atmel Wireless and Microcontrollers
Keywords :
digital signal processing chips; radiation hardening (electronics); 20 to 33 MHz; 5.0 V; ADSP-21020 digital signal processors; RH21020; TSC21020F; ionizing dose rate; multiple vendors; single event effects; total ionizing dose; Digital signal processing; Digital signal processors; Electronics packaging; Frequency; Ionizing radiation; Laboratories; Microcontrollers; Performance evaluation; System testing; Telephony;
Conference_Titel :
Radiation Effects Data Workshop, 2001 IEEE
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-7199-2
DOI :
10.1109/REDW.2001.960443
