SEE tests for commercial off-the-shelf DSPs to be used in a space experiment

Author

Menichelli, M. ; Alpat, B. ; Battiston, R. ; Bizzarri, M. ; Blasko, S. ; Burger, J. ; Caraffini, D. ; Gil, E. Cortina ; Dai, T. ; Haller, C. ; Kounine, A. ; Maris, O. ; Papi, A. ; Plyaskine, V. ; Schartd, D. ; Simon, R.S. ; Steuer, M.

Author_Institution

Dipt. di Fisica, Perugia Univ., Italy

fYear

2001

fDate

6/23/1905 12:00:00 AM

Firstpage

51

Lastpage

56

Abstract

DSPs from Analog Device (ADSP2187 and ADSP2189) have been tested for Single Event Effects (SEE) in order to be used in a Space Station Particle Physics experiment. We tested these devices at GSI (Darmstadt, Germany) with high energy (100 to 800 MeV/nucleon) xenon, gold and uranium ions. We also tested laser induced latchup on ADSP2187L. The results on cross section are compared with those obtained during the beam test

Keywords

aerospace instrumentation; automatic testing; digital signal processing chips; integrated circuit testing; ion beam effects; laser beam effects; nuclear electronics; ADSP2187L; COTS DSP chips; GSI test beam setup; SEE tests; Space Station particle physics experiment; commercial off-the-shelf DSPs; laser induced latchup; single event effects; Data acquisition; Digital signal processing; Extraterrestrial measurements; Instruments; Low earth orbit satellites; Performance evaluation; Radiation detectors; Space stations; Superconducting magnets; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 2001 IEEE

Conference_Location

Vancouver, BC

Print_ISBN

0-7803-7199-2

Type

conf

DOI

10.1109/REDW.2001.960448

Filename

960448