SEE evaluation of digital analog converters for space applications

Author

Scheick, L.Z.

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

fYear

2001

fDate

6/23/1905 12:00:00 AM

Firstpage

62

Lastpage

66

Abstract

SEE cross-sections were obtained for four different digital to analog converters (DACs). The different types of DAC tested were: the Analog Devices DAC8420, the Analog Devices AD768, the Maxim MAX539, and the Xicor X9C503. Both of the Analog Devices DACs and the Maxim part were seen to be immune to latch-up, not latching even at 120 MeV-cm²/mg. The Xicor part did latch-up with a threshold of 25 MeV-cm²/mg. Both Analog Devices DACs had clocked inputs which when constantly clocked rendered the device immune to SEU on the output line. The Xicor DAC had no clock option or function. All four devices had thresholds around 5 MeV-cm²/Mg for output SEU

Keywords

digital-analogue conversion; radiation effects; semiconductor device testing; space vehicle electronics; Analog Devices AD768; Analog Devices DAC8420; Maxim MAX539; SEE cross-sections; SEE evaluation; Xicor X9C503; clocked inputs; digital analog converters; latch-up threshold; output line SEU immunity; space applications; Aerospace electronics; Analog-digital conversion; Circuit testing; Clocks; Power supplies; Propulsion; Protection; Space missions; Space technology; Voltage control;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 2001 IEEE

Conference_Location

Vancouver, BC

Print_ISBN

0-7803-7199-2

Type

conf

DOI

10.1109/REDW.2001.960451

Filename

960451