Title :
Device susceptibility update: 1999-2000
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
This ninth biennial Compendium. continues the previous work of Nichols, et al., on single event effects (SEE) on microcircuits first published in 1985. Because of the volume of SEE data that has generated over past years, this Compendium only presents data collected and/or published in the last two years
Keywords :
integrated circuit testing; ion beam effects; neutron effects; proton effects; device susceptibility; heavy ion irradiation; microcircuit testing; neutron irradiation; proton irradiation; single event effects; Aerospace electronics; Aerospace testing; Automatic testing; Electronic equipment testing; Laboratories; Neutrons; Nuclear and plasma sciences; Physics; Propulsion; Protons;
Conference_Titel :
Radiation Effects Data Workshop, 2001 IEEE
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-7199-2
DOI :
10.1109/REDW.2001.960458
