Title :
An updated data compendium of enhanced low dose rate sensitive (ELDRS) bipolar linear circuits
Author :
Pease, R.L. ; McClure, S. ; Johnston, A.H. ; Gorelick, J. ; Turflinger, T.L. ; Gehlhausen, M. ; Krieg, J. ; Carriere, T. ; Shaneyfelt, M.
Author_Institution :
RLP Res., Albuquerque, NM, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
The 1996 total dose data compendium on ELDRS in bipolar linear circuits is updated. The new data include 37 data sets at high and low dose rate on 29 part types from nine manufacturers. A new table on elevated temperature irradiation has been added. References for each data set are provided
Keywords :
bipolar analogue integrated circuits; high-temperature electronics; radiation effects; bipolar linear circuit; elevated temperature irradiation; enhanced low dose rate sensitivity; total dose; Cranes; Life estimation; Linear circuits; Manufacturing; Operational amplifiers; Radiation effects; Satellites; Temperature; Testing; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2001 IEEE
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-7199-2
DOI :
10.1109/REDW.2001.960459
