• DocumentCode
    1722506
  • Title

    A compendium of single event transient data

  • Author

    Savage, M.W. ; Turflinger, T. ; Howard, J.W., Jr. ; Buchner, S.

  • Author_Institution
    NAVSEA Surface Warfare Center Div., Crane, IN, USA
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    134
  • Lastpage
    141
  • Abstract
    We present a compendium on observed Single Event Transients on analog and digital circuits. Both the data and the test methods used are presented
  • Keywords
    integrated circuit testing; radiation effects; transients; analog circuit; digital circuit; single event transient; test method; Circuit testing; Digital circuits; NASA; Oscilloscopes; Sampling methods; Single event transient; Single event upset; Space vector pulse width modulation; Telephony; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2001 IEEE
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    0-7803-7199-2
  • Type

    conf

  • DOI
    10.1109/REDW.2001.960460
  • Filename
    960460
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1722506