Title :
A compendium of single event transient data
Author :
Savage, M.W. ; Turflinger, T. ; Howard, J.W., Jr. ; Buchner, S.
Author_Institution :
NAVSEA Surface Warfare Center Div., Crane, IN, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
We present a compendium on observed Single Event Transients on analog and digital circuits. Both the data and the test methods used are presented
Keywords :
integrated circuit testing; radiation effects; transients; analog circuit; digital circuit; single event transient; test method; Circuit testing; Digital circuits; NASA; Oscilloscopes; Sampling methods; Single event transient; Single event upset; Space vector pulse width modulation; Telephony; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2001 IEEE
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-7199-2
DOI :
10.1109/REDW.2001.960460
