DocumentCode :
1722592
Title :
Impact of multistress aging on the dielectric relaxation behaviour of XLPE cable insulation
Author :
Reuter, M. ; Gockenbach, E. ; Borsi, H.
Author_Institution :
Inst. of Electr. Power Syst., Hannover Univ., Germany
Volume :
1
fYear :
2004
Firstpage :
339
Abstract :
This contribution reports on experimental investigations dealing with the impact of different combined aging parameters like electrical field strength, conductor temperature, and test duration on the dielectric relaxation behaviour of full-sized model cables with cross-linked polyethylene insulation. The evaluation of time-domain isothermal depolarisation current measurements turns out that characteristic properties of a third order exponential decay function exhibit different trends depending on the nature of the various aging factors.
Keywords :
XLPE insulation; cable insulation; conductors (electric); dielectric relaxation; electric field effects; strain ageing; XLPE cable insulation; combined aging parameters; conductor temperature; cross-linked polyethylene cable insulation; dielectric relaxation; electrical field strength; full-sized model cables; multistress aging impact; test duration; third order exponential decay function; time-domain isothermal depolarisation current measurements; Aging; Cable insulation; Cables; Conductors; Dielectrics and electrical insulation; Insulation testing; Isothermal processes; Polyethylene; Temperature; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on
Print_ISBN :
0-7803-8348-6
Type :
conf
DOI :
10.1109/ICSD.2004.1350360
Filename :
1350360
Link To Document :
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