Title :
Deep-Submicron MOS Transistor Matching: A Case Study
Author :
Dimitrov, Dimitar P.
Author_Institution :
Melexis-Bulgaria Ltd., Sofia
Abstract :
This article sets out to evaluate the MOS transistor mismatch in a standard 0.18 mum CMOS technology. It compares different methods for extracting MOS transistor matching parameters, and analyzes the drain current matching in detail. Test results are presented and analyzed.
Keywords :
CMOS integrated circuits; transistor circuits; CMOS technology; deep-submicron MOS transistor matching; drain current matching; size 0.18 mum; CMOS process; CMOS technology; Electronic circuits; MOSFETs; Predictive models; Production; Semiconductor device manufacture; Semiconductor devices; Testing; Threshold voltage;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and Systems, 2008. DDECS 2008. 11th IEEE Workshop on
Conference_Location :
Bratislava
Print_ISBN :
978-1-4244-2276-0
Electronic_ISBN :
978-1-4244-2277-7
DOI :
10.1109/DDECS.2008.4538744
