Title :
Manufacturer variability of enhanced low dose rate sensitivity (ELDRS) in a voltage comparator
Author :
Krieg, Jeff ; Tuflinger, Tom ; Pease, Ronald
Author_Institution :
NAVSEA Crane, IN, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
The variability in total dose response of a voltage comparator from five manufacturers is examined. The total dose degradation of input bias current varies by a factor of 100 among manufacturers and only three of the five exhibit ELDRS
Keywords :
bipolar integrated circuits; comparators (circuits); integrated circuit testing; radiation effects; sensitivity; ELDRS; bipolar linear circuits; enhanced low dose rate sensitivity; input bias current degradation; space environment; total dose response variability; voltage comparator; Circuit testing; Cranes; Degradation; Life estimation; Manufacturing; Packaging; Performance evaluation; Plastics; Temperature; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2001 IEEE
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-7199-2
DOI :
10.1109/REDW.2001.960468
