Title :
CMOS imager based on single photon avalanche diodes
Author :
Niclass, Cristiano ; Rochas, Alexis ; Besse, Pierre-Andre ; Popovic, Radivoje S. ; Charbon, Edoardo
Author_Institution :
Ecole Polytechnique Federale de Lausanne, Switzerland
Abstract :
In this paper we report on a 32×32 optical imager based on single photon avalanche diodes integrated in CMOS technology. The maximum measured dynamic range is 120dB and the minimum noise equivalent intensity is 1.3 × 10-3 lx. The minimum integration time per pixel is 4 μs. The output of each pixel is digital, thereby requiring no complex read-out circuitry, no amplification, no sample and hold, and no ADC.
Keywords :
CMOS image sensors; avalanche photodiodes; 1024 pixel; 32 pixel; 4 mus; CMOS imager; SPAD arrays; optical imager; single photon avalanche diodes; Avalanche photodiodes; CMOS image sensors; CMOS technology; Detectors; Diodes; Integrated circuit measurements; Optical noise; Optoelectronic and photonic sensors; Probability; Pulse measurements;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
Print_ISBN :
0-7803-8994-8
DOI :
10.1109/SENSOR.2005.1496631
