Title :
Symbolic nodal analysis of analog integrated circuits using pathological elements
Author :
Tlelo-Cuautle, E. ; Sánchez-López, C. ; Tan, Sheldon X -D
Author_Institution :
Dept. of Electron., INAOE, Puebla, Mexico
Abstract :
Improvements in analog signal processing applications require the selection of adequate active devices. However, each kind of active device offers different port-characteristics. For instance, the parasitic elements play an important role in selecting the best one for a given application. Symbolic nodal analysis is a useful tool to derive electrical characteristics of analog circuits, but compact models for the active devices are required to generate small matrices and analytical expressions. That way, this paper shows the usefulness of using pathological elements to generate behavioral models including dominant parasitic elements. The proposed approach is useful for the selection of active devices in analog design and synthesis procedures.
Keywords :
active networks; analogue integrated circuits; integrated circuit design; active devices; analog integrated circuits; analog signal processing applications; dominant parasitic elements; electrical characteristics; parasitic elements; pathological elements; symbolic nodal analysis; Admittance; Analog circuits; Analytical models; Integrated circuit modeling; Mathematical model; Mirrors; Pathology;
Conference_Titel :
New Circuits and Systems Conference (NEWCAS), 2012 IEEE 10th International
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-0857-1
Electronic_ISBN :
978-1-4673-0858-8
DOI :
10.1109/NEWCAS.2012.6328981