• DocumentCode
    1722820
  • Title

    Symbolic nodal analysis of analog integrated circuits using pathological elements

  • Author

    Tlelo-Cuautle, E. ; Sánchez-López, C. ; Tan, Sheldon X -D

  • Author_Institution
    Dept. of Electron., INAOE, Puebla, Mexico
  • fYear
    2012
  • Firstpage
    161
  • Lastpage
    164
  • Abstract
    Improvements in analog signal processing applications require the selection of adequate active devices. However, each kind of active device offers different port-characteristics. For instance, the parasitic elements play an important role in selecting the best one for a given application. Symbolic nodal analysis is a useful tool to derive electrical characteristics of analog circuits, but compact models for the active devices are required to generate small matrices and analytical expressions. That way, this paper shows the usefulness of using pathological elements to generate behavioral models including dominant parasitic elements. The proposed approach is useful for the selection of active devices in analog design and synthesis procedures.
  • Keywords
    active networks; analogue integrated circuits; integrated circuit design; active devices; analog integrated circuits; analog signal processing applications; dominant parasitic elements; electrical characteristics; parasitic elements; pathological elements; symbolic nodal analysis; Admittance; Analog circuits; Analytical models; Integrated circuit modeling; Mathematical model; Mirrors; Pathology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    New Circuits and Systems Conference (NEWCAS), 2012 IEEE 10th International
  • Conference_Location
    Montreal, QC
  • Print_ISBN
    978-1-4673-0857-1
  • Electronic_ISBN
    978-1-4673-0858-8
  • Type

    conf

  • DOI
    10.1109/NEWCAS.2012.6328981
  • Filename
    6328981