Title :
A size sensitivity method for interactive MOS circuit sizing
Author :
Chen, Jiajun ; Shi, Guoyong ; Tai, Andy ; Lee, Frank
Author_Institution :
Sch. of Microelectron., Shanghai Jiao Tong Univ., Shanghai, China
Abstract :
A device size sensitivity method is proposed for metal oxide semiconductor (MOS) analog circuit sizing. The sensitivity computation issues are discussed in detail. It is pointed out that the dc sensitivity is important for the accuracy of size-referred ac sensitivity. Moreover, it is highlighted that a symbolic approach to ac sensitivity computation is advantageous for interactive sizing. Emphasis is placed on the behavioral intuition extractable from the ac sensitivity to device sizes. The basic principle developed in this work is believed useful for developing a semi-automatic and interactive analog sizing tool. An EKV model based design example shows how the proposed procedure can be used for interactive circuit sizing.
Keywords :
MIS devices; semiconductor device models; EKV model based design; ac sensitivity computation; interactive MOS circuit sizing; interactive metal oxide semiconductor analog circuit sizing; semiautomatic analog sizing; sensitivity computation issues; size sensitivity method; size-referred ac sensitivity; symbolic approach; Analog circuits; Computational modeling; Integrated circuit modeling; Mathematical model; Semiconductor device modeling; Sensitivity analysis; Device sizing; EKV model; size-referred sensitivity; symbolic computation;
Conference_Titel :
New Circuits and Systems Conference (NEWCAS), 2012 IEEE 10th International
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-0857-1
Electronic_ISBN :
978-1-4673-0858-8
DOI :
10.1109/NEWCAS.2012.6328983
