• DocumentCode
    172291
  • Title

    Behavior of low voltage varistors under very fast oscillatory type current impulse environment

  • Author

    Kumara, L.D. ; Edirisinghe, M. ; Cooray, V.

  • Author_Institution
    Dept. of Phys., Univ. of Colombo, Colombo, Sri Lanka
  • fYear
    2014
  • fDate
    11-18 Oct. 2014
  • Firstpage
    1577
  • Lastpage
    1582
  • Abstract
    In this study, the behavior of low voltage varistors under very fast oscillatory type non standard current impulses were analyzed. The experiment was performed on 20 mm disk varistors with different nominal operating voltages of 14V, 30 V, 40 V, 75 V, 150 V, 250 V and 275 V. Non standard current impulses were generated using a Van De Graaff generator. The shape of the impulse was like a double exponential oscillatory type wave which has the oscillation frequency of 14.53 MHz. The rise time of the impulse was 8 ns with a maximum peak current rate-of-rise is of 2.41 × 1011 A/s. According to the results, under vary fast non standard current impulse environment, clamping voltage could be depend on both nominal voltage of varistors as well as its disk diameter. Another important feature of the voltage signatures observed was the DC offset voltage causes between terminals of varistor immediately after it triggered due injected fast current impulses.
  • Keywords
    clamps; electrostatic generators; pulse generators; surge protection; varistors; DC offset voltage; clamping voltage; double exponential oscillatory type wave; frequency 14.53 MHz; low voltage disk varistor signature; size 20 mm; surge protection; van de Graaff generator; very fast oscillatory type nonstandard current impulse; voltage 14 V; voltage 150 V; voltage 250 V; voltage 275 V; voltage 30 V; voltage 40 V; voltage 75 V; Electrodes; Generators; Oscilloscopes; Resistance; Varistors; fast transients; surge protection; varistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lightning Protection (ICLP), 2014 International Conference o
  • Conference_Location
    Shanghai
  • Type

    conf

  • DOI
    10.1109/ICLP.2014.6973381
  • Filename
    6973381