A new low frequency high voltage insulation analyzer using transient methods

Author

Steiner, J.P. ; Quinlan, J.P. ; Braun, J.M. ; Morra, R.M. ; Sedding, H.G.

Author_Institution

AVO Biddle Instrum., Blue Bell, PA, USA

fYear

1992

Firstpage

328

Lastpage

333

Abstract

The authors present the results obtained on several aged cable insulation types using very low frequency (⩽1 Hz) tan δ measurements performed in the laboratory. The large changes in tan δ recorded as a function of aging prompted the development of a field instrument capable of performing high-voltage low-frequency measurements on long lengths of aged cables. The authors present the critical requirements which must be met in designing an instrument for performing such low-frequency measurements in the field and provide an illustration of typical results. Preliminary measurements indicate that the analyzer will provide a technique with which to evaluate aging of power, control, and instrumentation cables in power stations

Keywords

cable insulation; cable testing; dielectric loss measurement; high-voltage techniques; insulation testing; portable instruments; power cables; time-domain analysis; transient analysers; aged cable insulation; control cables; field instrument; high voltage; instrumentation cables; insulation analyzer; loss tangent; low frequency; power cables; time domain dielectric spectrometer; transient methods; Aging; Cables; Circuit testing; Current measurement; Dielectric measurements; Frequency measurement; Instruments; Insulation testing; Low voltage; Transient analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena, 1992. Annual Report. Conference on

Conference_Location

Victoria, BC

Print_ISBN

0-7803-0565-5

Type

conf

DOI

10.1109/CEIDP.1992.283167

Filename

283167