• DocumentCode
    1723431
  • Title

    RC-Cache: Soft error mitigation techniques for low-leakage on-chip caches

  • Author

    Sun, Yan ; Zhang, Minxuan ; Li, Shaoqing ; Song, Chao ; Zhao, Yali

  • Author_Institution
    Sch. of Comput., Nat. Univ. of Defense Technol., Changsha, China
  • Volume
    3
  • fYear
    2010
  • Abstract
    This paper presents a kind of reliable low-leakage cache - RC-Cache, to solve the problem of high soft error rate in low-leakage on-chip caches. The proposed structure combines circuit technique and micro-architecture technique, and can reduce impacts of soft errors on leakage power optimization technique of caches. At circuit level, we improve the soft error immune of SRAM through specially designed soft error immune SRAM cell - SI-SRAM; at microarchitecture level, we reduce the soft error vulnerability of low-leakage caches by burst-based access prediction and early write-back operation. Experimental results show that in normal mode, soft error rate of RC-Cache is only 1/7 of the conventional cache, and in drowsy mode it is just 2/5. The techniques significantly improve the reliability of caches and, to a certain extent, mitigate soft error problem of low-leakage on-chip caches.
  • Keywords
    SRAM chips; cache storage; circuit analysis computing; fault diagnosis; leakage currents; memory architecture; power aware computing; RC-cache; SRAM cell; burst-based access prediction; circuit technique; leakage power optimization; low-leakage cache; microarchitecture technique; soft error mitigation technique; write-back operation; Computer architecture; Error analysis; Logic gates; Microprocessors; Random access memory; Reliability; Transistors; SRAM; drowsy cache; leakage; low-power; reliability; soft error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing Systems (ICSPS), 2010 2nd International Conference on
  • Conference_Location
    Dalian
  • Print_ISBN
    978-1-4244-6892-8
  • Electronic_ISBN
    978-1-4244-6893-5
  • Type

    conf

  • DOI
    10.1109/ICSPS.2010.5555852
  • Filename
    5555852