Title :
Universal Pin Electronics in portable testers
Author :
Parker, Les ; Koelling, Robert
Author_Institution :
Giordano Associates Inc., St. Petersburg, FL, USA
Abstract :
The advantages of using a tester-per-pin concept in portable test stations are examined. These include: improved throughput, reduced tester size and power requirements, broadside test functions, multiport testing and reduced costs. Methods of extending digital and analog test frequencies to 75 MHz and of generating highly accurate clock subsystems are examined, along with unit-under-test (UUT) interface design considerations
Keywords :
automatic test equipment; computer architecture; 75 MHz; ATE; Universal Pin Electronics; costs; multiport testing; portable testers; power requirements; size; tester-per-pin; throughput; unit under test interface; Automatic testing; Circuit testing; Costs; Electronic equipment testing; Electronics packaging; Frequency; Hardware; Memory management; Production facilities; System testing;
Conference_Titel :
AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings
Conference_Location :
Minneapolis, MN
DOI :
10.1109/AUTEST.1988.9605
