• DocumentCode
    1723434
  • Title

    Universal Pin Electronics in portable testers

  • Author

    Parker, Les ; Koelling, Robert

  • Author_Institution
    Giordano Associates Inc., St. Petersburg, FL, USA
  • fYear
    1988
  • Firstpage
    165
  • Lastpage
    168
  • Abstract
    The advantages of using a tester-per-pin concept in portable test stations are examined. These include: improved throughput, reduced tester size and power requirements, broadside test functions, multiport testing and reduced costs. Methods of extending digital and analog test frequencies to 75 MHz and of generating highly accurate clock subsystems are examined, along with unit-under-test (UUT) interface design considerations
  • Keywords
    automatic test equipment; computer architecture; 75 MHz; ATE; Universal Pin Electronics; costs; multiport testing; portable testers; power requirements; size; tester-per-pin; throughput; unit under test interface; Automatic testing; Circuit testing; Costs; Electronic equipment testing; Electronics packaging; Frequency; Hardware; Memory management; Production facilities; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings
  • Conference_Location
    Minneapolis, MN
  • Type

    conf

  • DOI
    10.1109/AUTEST.1988.9605
  • Filename
    9605
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1723434