• DocumentCode
    1723734
  • Title

    Fractal dimension and high order statistics of spectral energy distribution as features for pathology detection in brain MR images

  • Author

    Lahmiri, Salim ; Boukadoum, Mounir

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Quebec at Montreal (UQAM), Montreal, QC, Canada
  • fYear
    2012
  • Firstpage
    293
  • Lastpage
    296
  • Abstract
    A new methodology to detect pathologies in human brain magnetic resonance (MR) images is investigated. It is based on edge extraction in the Hilbert domain and subsequent analysis by means of fractal dimension and spectral energy distribution high order statistics. The technique is particularly suitable for pathologies characterized by bright structures in the MR images as do Glioma and Metastatic bronchogenic carcinoma. When classifying normal versus abnormal images dues to these two pathologies, ANOVA statistics show that the suggested features have strong between-classes differences, and the obtained classification accuracy by support vector machines is 99.9%±0.006. In comparison, applying a standard feature extraction technique based on the discrete wavelet transform (DWT) and principal component analysis (PCA) yielded 85.2%±0.05 accuracy.
  • Keywords
    biomedical MRI; brain; discrete wavelet transforms; edge detection; feature extraction; fractals; higher order statistics; image classification; medical image processing; principal component analysis; support vector machines; ANOVA statistics; DWT; Hilbert domain; PCA; brain MR images; bright structures; classification accuracy; discrete wavelet transform; edge extraction; feature extraction technique; fractal dimension; glioma; high order statistics; human brain magnetic resonance images; metastatic bronchogenic carcinoma; pathology detection; principal component analysis; spectral energy distribution; support vector machines; Discrete wavelet transforms; Feature extraction; Fractals; Image edge detection; Kernel; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    New Circuits and Systems Conference (NEWCAS), 2012 IEEE 10th International
  • Conference_Location
    Montreal, QC
  • Print_ISBN
    978-1-4673-0857-1
  • Electronic_ISBN
    978-1-4673-0858-8
  • Type

    conf

  • DOI
    10.1109/NEWCAS.2012.6329014
  • Filename
    6329014