DocumentCode :
1723898
Title :
A nested electrostatically-actuated microvalve for an integrated microflow controller
Author :
Robertson, Janet K. ; Wise, Kensall D.
Author_Institution :
Center for Integrated Sensors & Circuits, Michigan Univ., Ann Arbor, MI, USA
fYear :
1994
fDate :
6/16/1905 12:00:00 AM
Firstpage :
7
Lastpage :
12
Abstract :
Many semiconductor processes such as molecular beam epitaxy, low-pressure chemical vapor deposition, and reactive ion etching require precise control of ultraclean gas flows at very low flow rates. These applications are well suited to small electrostatically-actuated microvalves that can be merged with micromachined flow channels to form an integrated microflow controller (μFC). This paper presents such a microvalve structure and its integration into a simple prototype μFC. Produced using a nested bulk dissolved-wafer process, the microvalves utilize a three-electrode configuration which allows them to be actively pulled into both the on- and off-states. The valves actuate at 45-60 V, depending on dimensions. The μFC reported here was designed for a maximum flow rate of ISCCM and a leak rate of less then O.1 SCCM at a differential pressure of 100 Torr and outlet pressures from vacuum to atmospheric. The paper illustrates the design process used to optimize the structure to prevent stiction and ensure operation with the desired performance
Keywords :
adhesion; electrostatic devices; flow control; microactuators; micromachining; valves; 100 torr; 45 to 60 V; design process; integrated microflow controller; micromachined flow channels; nested bulk dissolved-wafer process; nested electrostatically-actuated microvalve; semiconductor processes; stiction prevention; three-electrode configuration; ultraclean gas flows; very low flow rates; Design optimization; Electrostatics; Etching; Microvalves; Molecular beam epitaxial growth; Process design; Prototypes; Seals; Testing; Valves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 1994, MEMS '94, Proceedings, IEEE Workshop on
Conference_Location :
Oiso
Print_ISBN :
0-7803-1833-1
Type :
conf
DOI :
10.1109/MEMSYS.1994.555589
Filename :
555589
Link To Document :
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