DocumentCode
1724061
Title
Rectification of near-field images
Author
Gaikovich, K.P. ; Dryakhlushin, V.F. ; Nozdrin, Yu.N. ; Reznik, A.N. ; Vaks, V.L. ; Zhilin, A.V.
Author_Institution
Inst. for Phys. of Microstructures, Acad. of Sci., Nizhny Novgorod, Russia
Volume
1
fYear
2002
fDate
6/24/1905 12:00:00 AM
Firstpage
192
Abstract
Significant enhancement of resolution in the scanning near-field optical microscopy (SNOM) and in microwave subsurface imaging is achieved by deconvolution of measured 2-D distributions using Tikhonov´s method. This method makes it possible to obtain much better sharpness of images.
Keywords
deconvolution; image processing; image resolution; near-field scanning optical microscopy; 2-D distributions; SNOM; Tikhonov´s method; deconvolution; image resolution; image sharpness; microwave subsurface imaging; near-field image rectification; scanning near-field optical microscopy; Extraterrestrial measurements; Image resolution; Magnetic field measurement; Microwave imaging; Optical distortion; Optical films; Optical imaging; Optical microscopy; Probes; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
Transparent Optical Networks, 2002. Proceedings of the 2002 4th International Conference on
Print_ISBN
0-7803-7375-8
Type
conf
DOI
10.1109/ICTON.2002.1009543
Filename
1009543
Link To Document