Title :
A 200 MSPS 10-bit pipelined ADC using digital calibration
Author :
Morin, D. ; Savaria, Y. ; Sawan, M.
Author_Institution :
Dept. of Elec. Eng., Ecole Polytechnique de Montreal, Que., Canada
Abstract :
We present in this paper the design and implementation of a 10-bit, 200 Mega samples per second (MSPS) pipelined and digitally calibrated analog-to-digital converter (ADC). The proposed ADC is based on simple topologies of analog building blocks to reach the high sampling rate. On the other hand, the achieved combination of resolution and performances are due to digital calibration, which allows compensating the nonlinearity introduced by the simplified architectures of analog circuits. This ADC was designed and implemented using CMOS 0.18μm technology.
Keywords :
CMOS analogue integrated circuits; analogue-digital conversion; calibration; integrated circuit design; 0.18 micron; 10 bit; CMOS technology; analog building block; analog circuits; digital calibration; high sampling rate; pipelined analog-to-digital converter; Analog-digital conversion; CMOS technology; Calibration; Circuit topology; Degradation; Equations; Error correction; Linearity; Pipeline processing; Transfer functions;
Conference_Titel :
IEEE-NEWCAS Conference, 2005. The 3rd International
Print_ISBN :
0-7803-8934-4
DOI :
10.1109/NEWCAS.2005.1496690
