• DocumentCode
    1724129
  • Title

    Web-Based Framework for Parallel Distributed Test

  • Author

    Ivask, Eero ; Raik, Jaan ; Ubar, Raimund

  • Author_Institution
    Tallinn Univ. of Technol., Tallinn
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper we describe Web-based distributed system suitable for acceleration of fault simulation in digital circuits. Framework has three-tier client server concept. Java applets are used for user interfaces. Java servlet on master server supports communication, task partitioning, user tracking, data management, etc. HTTP protocol based solution is used, since it is well established and flexible in firewall- protected environments. Reuse of existing test tools by encapsulation into Java agents extends the lifecycle and value of these tools. Considerable fault simulation speedup was gained in experiments. Two types of fault set partitioning were tried: adjacent fault selection and random fault selection. The latter is able to ensure more equal execution times for subtasks and therefore contributes to overall shorter parallel simulation time.
  • Keywords
    Internet; Java; circuit simulation; circuit testing; digital circuits; digital simulation; fault simulation; parallel processing; transport protocols; user interfaces; HTTP protocol; Java applets; Web-based distributed system; adjacent fault selection; data management; digital circuits; fault set partitioning; fault simulation; firewall-protected environments; parallel distributed test; parallel simulation; random fault selection; task partitioning; test tool reusing; three-tier client server; user interfaces; user tracking; Acceleration; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Java; Protection; Protocols; User interfaces; Web server;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits and Systems, 2008. DDECS 2008. 11th IEEE Workshop on
  • Conference_Location
    Bratislava
  • Print_ISBN
    978-1-4244-2276-0
  • Electronic_ISBN
    978-1-4244-2277-7
  • Type

    conf

  • DOI
    10.1109/DDECS.2008.4538800
  • Filename
    4538800