Title :
The Influence of Global Parametric Faults on Analogue Electronic Circuits Time Domain Response Features
Author :
Jantos, P. ; Grzechca, D. ; Golonek, T. ; Rutkowski, J.
Author_Institution :
Silesian Univ. of Technol., Gliwice
Abstract :
This paper presents an analysis of an influence of global parametric faults (GPF) on analogue integrated circuits (AIC) time domain (TD) response features, such as overshoot, delay time, rise time, maxima and minima, first differential maxima and minima. The novel approach is the analysis of relations and superrelations between features which are discussed in details. The presented results should increase testability and diagnosability of the global parametric faults on a production line of analogue and mixed electronic circuits. The observed AIC faults belong to parametric ones and are caused by technological process. GPF influence on aforementioned features is presented with the use of an exemplary circuit. A research presented in this paper may be used as an introduction to a fault driven test (FDT) diagnosis with the use of simulation before test (SBT) methods.
Keywords :
analogue integrated circuits; fault diagnosis; integrated circuit testing; analogue integrated circuits; fault driven test diagnosis; global parametric faults; mixed electronic circuits; simulation before test methods; time domain response features; Analog integrated circuits; Circuit faults; Circuit simulation; Circuit testing; Delay effects; Electronic circuits; Electronic equipment testing; Fault diagnosis; Production; Time domain analysis;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and Systems, 2008. DDECS 2008. 11th IEEE Workshop on
Conference_Location :
Bratislava
Print_ISBN :
978-1-4244-2276-0
Electronic_ISBN :
978-1-4244-2277-7
DOI :
10.1109/DDECS.2008.4538806
