Title :
A calibration procedure for on-wafer differential load-pull measurements
Author :
Spirito, M. ; van der Heijden, M.P. ; de Kok, M. ; de Vreede, L.C.N.
Author_Institution :
DIMES, Delft University of Technology, Netherlands
Abstract :
This paper presents a calibration technique for on-wafer diflerential load-pull measurements. The described calibration procedure makes use of a standard GS/SG calibration substrate only. The calibration accuracy achieved is verified through various independent standards measurement.
Keywords :
Calibration; Circuits; Differential amplifiers; Electronic components; Measurement standards; Power amplifiers; Power measurement; Power system reliability; Probes; Signal analysis;
Conference_Titel :
ARFTG Conference Digest, Spring 2003. 61st
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-7994-2
DOI :
10.1109/ARFTGS.2003.1216860
