• DocumentCode
    1724377
  • Title

    A calibration procedure for on-wafer differential load-pull measurements

  • Author

    Spirito, M. ; van der Heijden, M.P. ; de Kok, M. ; de Vreede, L.C.N.

  • Author_Institution
    DIMES, Delft University of Technology, Netherlands
  • fYear
    2003
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a calibration technique for on-wafer diflerential load-pull measurements. The described calibration procedure makes use of a standard GS/SG calibration substrate only. The calibration accuracy achieved is verified through various independent standards measurement.
  • Keywords
    Calibration; Circuits; Differential amplifiers; Electronic components; Measurement standards; Power amplifiers; Power measurement; Power system reliability; Probes; Signal analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest, Spring 2003. 61st
  • Conference_Location
    Philadelphia, PA, USA
  • Print_ISBN
    0-7803-7994-2
  • Type

    conf

  • DOI
    10.1109/ARFTGS.2003.1216860
  • Filename
    1216860
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1724377