• DocumentCode
    1724434
  • Title

    A low cost implementation of automated RF test of a LNA

  • Author

    Kaufman, Kris K. ; Baker, T.R.

  • Author_Institution
    Radio Products Division, Semiconductor Products Sector, Motorola, Inc., Tempe, AZ, USA
  • fYear
    2003
  • Firstpage
    23
  • Lastpage
    26
  • Abstract
    A low cost, automated, high volume RF test setup for a low-noise amplifier (LNA) was realized. A standard production DC test system and handler were modified with the addition of a standard vector network analyzer to measure sparameters at 1.9 GHz. Motivation for a low cost RF test methodology came from the need to minimize production costs of the high volume MBC13916 LNA. The solution achieved accurate and reliable low cost RF testing. An in-depth analysis of the test data was performed to correlate the data to the existing RF test setup and to verify the impact on the final cost per part of performing RF test.
  • Keywords
    Automatic testing; Costs; Measurement standards; Packaging machines; Performance evaluation; Production; Radio frequency; Software testing; System testing; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest, Spring 2003. 61st
  • Conference_Location
    Philadelphia, PA, USA
  • Print_ISBN
    0-7803-7994-2
  • Type

    conf

  • DOI
    10.1109/ARFTGS.2003.1216863
  • Filename
    1216863