DocumentCode
1724434
Title
A low cost implementation of automated RF test of a LNA
Author
Kaufman, Kris K. ; Baker, T.R.
Author_Institution
Radio Products Division, Semiconductor Products Sector, Motorola, Inc., Tempe, AZ, USA
fYear
2003
Firstpage
23
Lastpage
26
Abstract
A low cost, automated, high volume RF test setup for a low-noise amplifier (LNA) was realized. A standard production DC test system and handler were modified with the addition of a standard vector network analyzer to measure sparameters at 1.9 GHz. Motivation for a low cost RF test methodology came from the need to minimize production costs of the high volume MBC13916 LNA. The solution achieved accurate and reliable low cost RF testing. An in-depth analysis of the test data was performed to correlate the data to the existing RF test setup and to verify the impact on the final cost per part of performing RF test.
Keywords
Automatic testing; Costs; Measurement standards; Packaging machines; Performance evaluation; Production; Radio frequency; Software testing; System testing; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest, Spring 2003. 61st
Conference_Location
Philadelphia, PA, USA
Print_ISBN
0-7803-7994-2
Type
conf
DOI
10.1109/ARFTGS.2003.1216863
Filename
1216863
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