Waveguide technique for ferroelectric bulk and film microwave study

Non-resonant waveguide method is presented to study materials with large dielectric constant ϵ. The enhanced method is based on network analyzer use and combines benefits of all known techniques. An additional custom calibration procedure is employed. Gathering redundant data of scattering parameter frequency dependence accompanied with curve fitting data processing is implemented. To increase microwave penetration into studied large-ϵ specimen, a low-ϵ matching dielectric plate is adapted. The influence of air gaps between specimen and waveguide is studied and errors eliminated. Higher-order mode propagation conditions analysis is considered. Waveguide partial tilling is studied and applied as a new electrode-less technique for ferroelectric thin film study. Experimental results of reference materials investigation are presented.