First direct beta measurenent for parasitic lateral bipolar transistors in fully-depleted SOI MOSFETs
Author :
Ploeg, Eric Ver ; Nguyen, Cuong ; Kistler, Neal ; Won, Simon ; Woo, Jason ; Plummer, James
Author_Institution :
University of California
fYear :
1993
fDate :
6/15/1905 12:00:00 AM
Firstpage :
26
Lastpage :
27
Keywords :
Bipolar transistors; Charge carrier processes; Current measurement; Data mining; Electric breakdown; Feedback; Gain measurement; Impact ionization; MOSFET circuits; Voltage;
