DocumentCode
1724812
Title
Reproducibility in plasma polymerized methane films as determined by contact electrification measurements
Author
Burkett, S.L. ; Charlson, E.M. ; Charlson, E.J. ; Yasuda, H.K.
Author_Institution
Coll. of Eng., Missouri Univ., Columbia, MO, USA
fYear
1992
Firstpage
391
Lastpage
396
Abstract
The problem of charge variability has been resolved for plasma polymer films on silicon substrates using the contact-separation technique. Charge measurements demonstrated that variability in contact charging on samples deposited simultaneously is much lower than previously reported. The progress in this area is believed to be due to the fact that the films are uniform in thickness and are deposited on smooth substrates with controlled and reproducible deposition conditions. The effect of postdeposition ambient on the stability of film properties was also studied by monitoring the electrical properties over time with the contact-separation measurement. A postdeposition oxygen soak was found to minimize the changes in electrical parameters
Keywords
charge measurement; ellipsometry; plasma deposited coatings; polymer films; semiconductor-insulator boundaries; static electrification; thickness measurement; Si; charge measurements; charge variability; contact electrification measurements; contact-separation technique; electrical parameters; electrical properties; plasma polymerized methane films; postdeposition ambient; postdeposition oxygen soak; reproducible deposition conditions; smooth substrates; Charge measurement; Contacts; Electric variables measurement; Plasma measurements; Polymer films; Reproducibility of results; Silicon; Stability; Substrates; Thickness control;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1992. Annual Report. Conference on
Conference_Location
Victoria, BC
Print_ISBN
0-7803-0565-5
Type
conf
DOI
10.1109/CEIDP.1992.283220
Filename
283220
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