DocumentCode :
1724812
Title :
Reproducibility in plasma polymerized methane films as determined by contact electrification measurements
Author :
Burkett, S.L. ; Charlson, E.M. ; Charlson, E.J. ; Yasuda, H.K.
Author_Institution :
Coll. of Eng., Missouri Univ., Columbia, MO, USA
fYear :
1992
Firstpage :
391
Lastpage :
396
Abstract :
The problem of charge variability has been resolved for plasma polymer films on silicon substrates using the contact-separation technique. Charge measurements demonstrated that variability in contact charging on samples deposited simultaneously is much lower than previously reported. The progress in this area is believed to be due to the fact that the films are uniform in thickness and are deposited on smooth substrates with controlled and reproducible deposition conditions. The effect of postdeposition ambient on the stability of film properties was also studied by monitoring the electrical properties over time with the contact-separation measurement. A postdeposition oxygen soak was found to minimize the changes in electrical parameters
Keywords :
charge measurement; ellipsometry; plasma deposited coatings; polymer films; semiconductor-insulator boundaries; static electrification; thickness measurement; Si; charge measurements; charge variability; contact electrification measurements; contact-separation technique; electrical parameters; electrical properties; plasma polymerized methane films; postdeposition ambient; postdeposition oxygen soak; reproducible deposition conditions; smooth substrates; Charge measurement; Contacts; Electric variables measurement; Plasma measurements; Polymer films; Reproducibility of results; Silicon; Stability; Substrates; Thickness control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1992. Annual Report. Conference on
Conference_Location :
Victoria, BC
Print_ISBN :
0-7803-0565-5
Type :
conf
DOI :
10.1109/CEIDP.1992.283220
Filename :
283220
Link To Document :
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