Title :
Study of rough surface to decrease reverberation noise in ultrasonic imaging
Author :
Zhang, Jinying ; Han, Gang ; Chen, Shuming ; Qian, Yue ; Xu, Weijiang ; Carlier, Julien ; Nongaillard, Bertrand
Author_Institution :
Sch. of Comput., Nat. Univ. of Defense Technol., Changsha, China
Abstract :
Rough back surface is investigated to decrease the reverberation noise in ultrasonic imaging. Silicon crystal is selected as the backing substrate of the ultrasonic transducer because rough structure is convenient to be fabricated on silicon substrate using microfabrication technologies. Different dimensions of rough boundaries are designed and simulated to scatter the undesired waves based on finite element method modeling. Transient analysis indicates that a rough surface whose dimension (including depth and width) is around 1.0 λ should be considered to scatter a majority of incident waves.
Keywords :
acoustic noise; finite element analysis; reverberation; surface roughness; transient analysis; ultrasonic imaging; ultrasonic transducers; Si; Silicon crystal; backing substrate; finite element method modeling; incident waves; microfabrication; reverberation noise; transient analysis; ultrasonic imaging; ultrasonic transducer; Reflection; Reflectivity; Rough surfaces; Silicon; Surface roughness; Surface waves; Ultrasonic imaging;
Conference_Titel :
New Circuits and Systems Conference (NEWCAS), 2012 IEEE 10th International
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-0857-1
Electronic_ISBN :
978-1-4673-0858-8
DOI :
10.1109/NEWCAS.2012.6329068
