DocumentCode :
1725296
Title :
Impulse testing and turn insulation deterioration in electric motors
Author :
Wiedenbrug, E. ; Frey, G. ; Wilson, J.
fYear :
2003
Firstpage :
50
Lastpage :
55
Abstract :
Impulse testing has been an integral part of predictive maintenance of electrical motors for many years. The influence that extensive impulse testing has on a motor is investigated in this paper. The questions investigated are the following: can impulse testing damage healthy or deteriorated insulation? Can weak turn-to-turn insulation be diagnosed with DC resistance, Megger or HiPot tests? Are motors with weak insulation, as proven by impulse testing, able to operate after failing the test? Are motors that show a turn-turn short capable of continued operation? These questions have been investigated by putting a low voltage motor through exhaustive testing rigors, until a failure was induced. Following the failure, additional testing allowed further investigation designed to determine the possible deteriorating effects on turn-turn insulation due to impulse testing beyond the motor´s dielectric breakdown.
Keywords :
electric breakdown; electric motors; electric resistance measurement; failure analysis; impulse testing; insulation testing; machine insulation; machine testing; 460 V; 5 hp; 7.7 A; DC resistance test; HiPot test test; Megger test; deteriorated insulation; dielectric breakdown; electric motors; healthy insulation damage; impulse testing; low voltage motor; motor failure; predictive maintenance; turn insulation deterioration; turn-turn short; weak turn-to-turn insulation diagnosis; Costs; DC motors; Dielectrics and electrical insulation; Electric motors; Failure analysis; Impulse testing; Insulation testing; Predictive maintenance; Thermal resistance; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulp and Paper Industry Technical Conference, 2003. Conference Record of the 2003 Annual
Conference_Location :
Charleston, SC, USA
ISSN :
0190-2172
Print_ISBN :
0-7803-7931-4
Type :
conf
DOI :
10.1109/PAPCON.2003.1216899
Filename :
1216899
Link To Document :
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