Title :
Numerical simulations of on and off state characteristics of poly-siliconthin film transistors
Author :
Hack, M. ; Wu, I-Wei ; Lewis, A.G. ; King, T.J.
Author_Institution :
Xerox Palo Alto Research Center
fDate :
6/15/1905 12:00:00 AM
Keywords :
Computer hacking; Electric variables; Electron devices; Grain boundaries; Leakage current; Numerical simulation; Temperature dependence; Thin film transistors; Threshold voltage; Tunneling;
Conference_Titel :
Device Research Conference, 1993. 51st Annual
DOI :
10.1109/DRC.1993.1009601
