DocumentCode
1725507
Title
Numerical simulations of on and off state characteristics of poly-siliconthin film transistors
Author
Hack, M. ; Wu, I-Wei ; Lewis, A.G. ; King, T.J.
Author_Institution
Xerox Palo Alto Research Center
fYear
1993
fDate
6/15/1905 12:00:00 AM
Firstpage
105
Lastpage
106
Keywords
Computer hacking; Electric variables; Electron devices; Grain boundaries; Leakage current; Numerical simulation; Temperature dependence; Thin film transistors; Threshold voltage; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 1993. 51st Annual
Type
conf
DOI
10.1109/DRC.1993.1009601
Filename
1009601
Link To Document