Modeling dielectric dispersion by the relaxation method

Author

Al-Refaie, S.N.

Author_Institution

Dept. of Electron. Eng., Yarmouk Univ., Irbid, Jordan

Volume

2

fYear

2004

Firstpage

517

Abstract

The RTD corresponding to multiple-arc approach has been employed to investigate the effect of sintering temperature on the characteristics of metal-oxide varistor (MOV) dielectrics. The analysis has revealed the probable existence of phase transition in MOV near 700°C temperature. The separated polarization corresponding to ZnO grains and additive oxide diminishes at higher temperature, and merges into one category of polarization presumably dominated by the additive oxide modified by the shunting effect of ZnO grains.

Keywords

II-VI semiconductors; ceramics; dielectric materials; dielectric polarisation; permittivity; sintering; solid-state phase transformations; varistors; zinc compounds; 700 degC; ZnO; ZnO grains; additive oxide; dielectric dispersion; metal-oxide varistor dielectrics; multiple arc method; phase transition; polarization; relaxation method; relaxation time distribution; shunting effect; sintering temperature; Artificial intelligence; Ceramics; Dielectric constant; Dielectric measurements; Dispersion; Frequency; Heat treatment; Polarization; Relaxation methods; Temperature distribution;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on

Print_ISBN

0-7803-8348-6

Type

conf

DOI

10.1109/ICSD.2004.1350482

Filename

1350482