Title :
Compensation for within-die variations in dynamic logic by using body-bias
Author :
Azizi, Navid ; Najm, Farid N.
Author_Institution :
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
Abstract :
We propose a fine-grained scheme to compensate for within-die variations in dynamic logic to reduce the variation in leakage, delay and noise margin through body-biasing. We first show that the amount of body-bias compensation needed depends on the correlation that exists between gates, and then analytically show the possible reduction in the variance of the leakage of both a single and multiple dynamic logic gates. We then design a circuit to implement the system which provides the reduction in the variance of the leakage, delay and noise margin of dynamic logic gates and show that it produces a close match to the analytical results. In our design, the variance of a typical test circuit is reduced by 27% and the variance of the path delay is reduced by 33%.
Keywords :
compensation; leakage currents; logic design; logic gates; body bias; delay variation; dynamic logic gates; leakage variation; noise margin variation; variance reduction; within-die variation compensation; Analysis of variance; Circuit noise; Circuit testing; Circuit topology; Delay; Logic circuits; Logic gates; Monitoring; Noise reduction; Threshold voltage;
Conference_Titel :
IEEE-NEWCAS Conference, 2005. The 3rd International
Print_ISBN :
0-7803-8934-4
DOI :
10.1109/NEWCAS.2005.1496753