Title :
Managing data for a zero defect production: The contribution of manufacturing automation to a corporate strategy
Author :
Schmid, Gottfried ; Hanitzsch, Tilmann
Author_Institution :
Eng. Data Anal. & Reporting, Infineon Technol. AG, Regensburg, Germany
Abstract :
Most chips used for automotive applications do not tolerate failure. Next to design considerations, the effective use of all available production data is key to a successful “Zero Defect” strategy. The challenge to the Manufacturing Information Technology & Automation department begins with a massive amount of raw data to compute and extends to aggregation, categorization and evaluation of this data to trigger automated online reactions and support efficient engineering analysis.
Keywords :
automobile industry; automotive electronics; data handling; manufacturing data processing; production engineering computing; Manufacturing Information Technology & Automation department; automotive application; automotive safety application; data management; engineering analysis; raw data; zero defect production; Atmospheric measurements; Guidelines; Manufacturing; Metrology; Process control; Production; Testing; Analysis; aggregation; automated; automotive; categorization; configurability; detection; equipment; functional; inline; measurement; metrology; monitoring; production; results; statistical; test; tracequality; visualization; yield;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference (ASMC), 2011 22nd Annual IEEE/SEMI
Conference_Location :
Saratoga Springs, NY
Print_ISBN :
978-1-61284-408-4
Electronic_ISBN :
1078-8743
DOI :
10.1109/ASMC.2011.5898216
