DocumentCode :
172620
Title :
Ultra fast, two-bit ECC for Emerging Memories
Author :
Amato, P. ; Laurent, C. ; Sforzin, M. ; Bellini, Sandro ; Ferrari, Mauro ; Tomasoni, Alessandro
Author_Institution :
Micron Technol. Inc., Agrate Brianza, Italy
fYear :
2014
fDate :
18-21 May 2014
Firstpage :
1
Lastpage :
4
Abstract :
Emerging Memories (EMs) could benefit from Error Correcting Codes (ECCs) able to correct a few errors in just a few nanoseconds; for example to cope with failure mechanisms that could arise in new storage physics. Fast ECCs are also desired for eXecuted-in-Place (XiP) and DRAM applications. This paper shows the key elements to implement a BCH code able to correct 2 errors in a page of 256 data bits in no more than 10ns with 180nm-CMOS logic, and with low energy consumption. The decoding time can be further reduced to few ns using smaller gate length logics. Moreover, the proposed solution is soundly rooted in BCH theory, and can be applied to any user data size. Basically the ideas are to avoid the division in the computation of the coefficients of the Error Locator Polynomial (ELP) of the BCH code, to optimize the implementation of the multiplication in the Galois Fields (GF) and to fully implement the decoder in a parallel combinatorial architecture. Such a BCH code has been embedded in a 45nm 1Gbit Phase Change Memory (PCM) device.
Keywords :
BCH codes; CMOS logic circuits; CMOS memory circuits; DRAM chips; Galois fields; codecs; decoding; energy consumption; error correction codes; optimisation; phase change memories; polynomials; BCH code; BCH theory; CMOS logic; DRAM applications; ELP; EM; GF; Galois fields; PCM device; XiP applications; data bits; decoder; decoding time; emerging memories; energy consumption; error correcting codes; error locator polynomial; executed-in-place applications; failure mechanisms; gate length logics; parallel combinatorial architecture; phase change memory device; size 180 nm; size 45 nm; storage physics; two-bit ECC; user data size; Decoding; Delays; Error correction codes; Galois fields; Logic gates; Polynomials; Random access memory; BCH; DRAM; ECC; Emerging Memories; Error Correcting Codes; PCM;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Workshop (IMW), 2014 IEEE 6th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4799-3594-9
Type :
conf
DOI :
10.1109/IMW.2014.6849370
Filename :
6849370
Link To Document :
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