• DocumentCode
    1726629
  • Title

    Design and modeling methodology of embedded passives substrate in a compact wireless connectivity module

  • Author

    Chiu, Chi-Tsung ; Lee, Pao-Nan ; Chen, Chi-Han ; Lin, Yuan-Hung ; WU, Yei-Shen ; Ou, Ying-Te ; Hsu, Chih-Jing

  • Author_Institution
    R&D Div., Adv. Semicond. Eng. Inc., Kaohsiung, Taiwan
  • fYear
    2011
  • Firstpage
    144
  • Lastpage
    149
  • Abstract
    A novel wireless connectivity module by using embedded high dielectric constant (Dk) material in a 6 layer build-up substrate to form the passive circuit is presented. The module shows 18% size shrinking while embedded BPF, Balun and Divider circuit. The embedded BPF and Balun show 2 dB and 1 dB insertion loss at passband respectively. An efficient design methodology is demonstrated for high performance and yield prediction. It shows good correlation between design and measurement validation. In this study, the packaging level reliability test is proceeded to investigate the function degradation after aging process. It is suggested the embedded circuit design margin should include manufacturing tolerance, pattern deform and material property change after aging process.
  • Keywords
    Bluetooth; ageing; circuit reliability; electronics packaging; network synthesis; passive networks; permittivity; wireless LAN; Bluetooth-WLAN combo module design; aging process; balun; build-up substrate; compact wireless connectivity module; divider circuit; embedded circuit design; embedded high dielectric constant material; embedded passives substrate; function degradation; insertion loss; packaging level reliability test; passive circuit; pattern deformation; Band pass filters; Capacitors; Impedance matching; Insertion loss; Integrated circuit modeling; Radio frequency; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898505
  • Filename
    5898505