Reliable solid-electrolyte crossbar switch for programmable logic device

Author

Banno, N. ; Sakamoto, T. ; Tada, M. ; Miyamura, M. ; Yabe, Y. ; Saito, Y. ; Ishida, S. ; Okamoto, K. ; Hada, H. ; Kasai, N. ; Iguchi, N. ; Aono, M.

Author_Institution

Device Platforms Res. Labs., NEC Corp., Sagamihara, Japan

fYear

2010

Firstpage

115

Lastpage

116

Abstract

Solid-electrolyte crossbar switch (namely NanoBridge) with low programming current of 420μA and highly reliable ON state against pulsed-alternating current (AC) stress is demonstrated under practical operating conditions of a programmable logic device (PLD). The ON-state duration under a pulsed-AC stress is achieved >10 years at 150°C. The high reliability under AC originates from the fact that the stress induced by Cu⁺ ion migration at a negative bias is recovered by a positive bias. NanoBridge is applicable in a scaled-down, nonvolatile PLD for hp28 and beyond.

Keywords

nanotechnology; programmable logic devices; solid electrolytes; ON-state duration; current 420 muA; nanobridge; programmable logic device; pulsed-alternating current stress; solid-electrolyte crossbar switch; temperature 150 C; Copper; Integrated circuit reliability; Resistance; Stress; Switches; Wire; programmable logic; reliability under AC stress; solid-electrolyte switch;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Technology (VLSIT), 2010 Symposium on

Conference_Location

Honolulu

Print_ISBN

978-1-4244-5451-8

Electronic_ISBN

978-1-4244-5450-1

Type

conf

DOI

10.1109/VLSIT.2010.5556192

Filename

5556192