Title :
Analysis of a p+p-n-n+ diode structure
Author :
Chen, Min ; Lutz, Josef ; Felsl, Hans-Peter ; Schulze, Hans-Joachim
Author_Institution :
Chemnitz Univ. of Technol., Chemnitz
Abstract :
In this paper we present a p+p-n-n+ diode structure, an extension of the FM-diode the authors have discussed in previous work. This design can be seen as a simplified structure and provides further advantages for the device behavior. Static and dynamic breakdown will be further postponed by remodeling the electric field distribution. Furthermore, in the tail phase of the reverse recovery period, the dynamic avalanche is postponed and ends earlier.
Keywords :
electric fields; semiconductor diodes; FM-diode; diode structure; electric field distribution; reverse recovery period; Anodes; Cathodes; Chemical technology; Current density; Doping; Electric breakdown; Power semiconductor devices; Semiconductor diodes; Tail; Voltage;
Conference_Titel :
Power Semiconductor Devices and IC's, 2008. ISPSD '08. 20th International Symposium on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1532-8
Electronic_ISBN :
978-1-4244-1533-5
DOI :
10.1109/ISPSD.2008.4538921