DocumentCode
1726825
Title
Analysis of a p+p-n-n+ diode structure
Author
Chen, Min ; Lutz, Josef ; Felsl, Hans-Peter ; Schulze, Hans-Joachim
Author_Institution
Chemnitz Univ. of Technol., Chemnitz
fYear
2008
Firstpage
153
Lastpage
156
Abstract
In this paper we present a p+p-n-n+ diode structure, an extension of the FM-diode the authors have discussed in previous work. This design can be seen as a simplified structure and provides further advantages for the device behavior. Static and dynamic breakdown will be further postponed by remodeling the electric field distribution. Furthermore, in the tail phase of the reverse recovery period, the dynamic avalanche is postponed and ends earlier.
Keywords
electric fields; semiconductor diodes; FM-diode; diode structure; electric field distribution; reverse recovery period; Anodes; Cathodes; Chemical technology; Current density; Doping; Electric breakdown; Power semiconductor devices; Semiconductor diodes; Tail; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and IC's, 2008. ISPSD '08. 20th International Symposium on
Conference_Location
Orlando, FL
Print_ISBN
978-1-4244-1532-8
Electronic_ISBN
978-1-4244-1533-5
Type
conf
DOI
10.1109/ISPSD.2008.4538921
Filename
4538921
Link To Document