• DocumentCode
    1726825
  • Title

    Analysis of a p+p-n-n+ diode structure

  • Author

    Chen, Min ; Lutz, Josef ; Felsl, Hans-Peter ; Schulze, Hans-Joachim

  • Author_Institution
    Chemnitz Univ. of Technol., Chemnitz
  • fYear
    2008
  • Firstpage
    153
  • Lastpage
    156
  • Abstract
    In this paper we present a p+p-n-n+ diode structure, an extension of the FM-diode the authors have discussed in previous work. This design can be seen as a simplified structure and provides further advantages for the device behavior. Static and dynamic breakdown will be further postponed by remodeling the electric field distribution. Furthermore, in the tail phase of the reverse recovery period, the dynamic avalanche is postponed and ends earlier.
  • Keywords
    electric fields; semiconductor diodes; FM-diode; diode structure; electric field distribution; reverse recovery period; Anodes; Cathodes; Chemical technology; Current density; Doping; Electric breakdown; Power semiconductor devices; Semiconductor diodes; Tail; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and IC's, 2008. ISPSD '08. 20th International Symposium on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4244-1532-8
  • Electronic_ISBN
    978-1-4244-1533-5
  • Type

    conf

  • DOI
    10.1109/ISPSD.2008.4538921
  • Filename
    4538921