Title :
Measurement of pressure wave from AC tree in polymeric insulators and time-frequency analysis using wavelet transform
Author :
Kadowaki, K. ; Nishimoto, S. ; Kitani, I.
Author_Institution :
Fac. of Electr. & Electron. Eng., Ehime Univ., Matsuyama, Japan
Abstract :
Degradation process of polyolefin materials subjected to an ac voltage was studied by wavelet analysis of the pressure wave associated with tree growth under a point-plane electrode configuration. Pressure waves from a block sample, which was composed of low-density-polyethylene (LDPE) and ethylene-ethylacrylate (EEA), were measured by an AE sensor on the back of the plane electrode. Results of the time-frequency analysis of the pressure signal showed that a high frequency pressure wave due to partial discharge at the front area in the tree was followed by a lower frequency pressure wave due to partial discharge near the point electrode. In a sample of LDPE alone without EEA, only the lower frequency pressure wave disappeared when the treeing degradation proceeded to a critical level. The disappearance suggested that carbonization at the rear area in the tree was caused by repetitive discharges. However, the disappearance phenomenon did not observed for a LDPE/EEA blended sample. We confirmed that there was an optimum blend ratio between LDPE and EEA for the inhibition of carbonization.
Keywords :
acoustic emission; partial discharges; polymer blends; polymer insulators; pressure measurement; pressure sensors; time-frequency analysis; trees (electrical); wavelet transforms; AC tree growth; AE sensor; EEA; LDPE; carbonization; degradation process; ethylene-ethylacrylate; high frequency pressure wave; low density polyethylene; partial discharge; point-plane electrode configuration; polymer blends; polymeric insulators; polyolefin materials; pressure wave measurement; time-frequency analysis; wavelet transform; Degradation; Electrodes; Partial discharges; Plastic insulation; Polymers; Pressure measurement; Time frequency analysis; Trees - insulation; Wavelet analysis; Wavelet transforms;
Conference_Titel :
Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on
Print_ISBN :
0-7803-8348-6
DOI :
10.1109/ICSD.2004.1350533