Title :
Enabling application-specific integrated circuits on limited pattern constructs
Author :
Morris, Daniel ; Rovner, Vyacheslav ; Pileggi, Larry ; Strojwas, Andrzej ; Vaidyanathan, Kaushik
Author_Institution :
Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
Implementing sub-22nm designs using a limited set of pattern constructs can eliminate hotspot risk and can control systematic variability. Pattern regularity can incur a cell-level density penalty that is minimized or eliminated by co-optimization with circuits. More importantly, design with a limited set of pattern constructs can remove the limitations imposed by complex design rules, thus facilitating flexible synthesis of logic and memory blocks in place of hard IP.
Keywords :
application specific integrated circuits; circuit optimisation; integrated circuit design; integrated memory circuits; application-specific integrated circuit; cell-level density penalty; circuit cooptimization; complex design rule; flexible synthesis; logic block; memory block; pattern constructs; pattern regularity; size 22 nm; systematic variability; Gratings; IP networks; Layout; Logic gates; Random access memory; Shape; Systematics;
Conference_Titel :
VLSI Technology (VLSIT), 2010 Symposium on
Conference_Location :
Honolulu
Print_ISBN :
978-1-4244-5451-8
Electronic_ISBN :
978-1-4244-5450-1
DOI :
10.1109/VLSIT.2010.5556202