• DocumentCode
    1727164
  • Title

    Low frequency noise characterization of very large value resistors

  • Author

    Arnaboldi, C. ; Bucci, C. ; Cremonesi, O. ; Fascilla, A. ; Nucciotti, A. ; Pavan, M. ; Pessina, G. ; Pirro, S. ; Previtali, E. ; Sisti, M.

  • Author_Institution
    Ist. Nazionale di Fisica Nucl., Milan, Italy
  • Volume
    2
  • fYear
    2001
  • Firstpage
    768
  • Abstract
    A very simple circuit configuration is described which allows to characterize the noise of very large value resistors. With this measurement setup we investigated the low frequency noise of large value resistors, tens of GΩ range, realized with different technologies, at different bias voltages. A technique is suggested that allows to reduce the low frequency noise contribution, by optimizing the connecting arrangement. A short review of the resistor noise theory is given.
  • Keywords
    circuit noise; nuclear electronics; radiation monitoring; resistors; bias voltages; low frequency noise characterization; radiation detectors; very large value resistors; Bolometers; Circuit noise; Detectors; Electrical resistance measurement; Low-frequency noise; Noise measurement; Resistors; Thermal resistance; Transfer functions; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2001 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-7324-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2001.1009671
  • Filename
    1009671