Title :
Diagnostics of LATGS single crystals doped with Pt(IV) ions and L-alanine for infrared applications
Author :
Novotný, J. ; Zelinka, J. ; Podvalová, Z.
Author_Institution :
Inst. of Radio Eng. & Electron., Acad. of Sci. of the Czech Republic, Prague, Czech Republic
Abstract :
A novel type of full-faceted single crystals of triglycine sulfate (TGS) with various contents of Pt(IV) complex-forming ions and L-alanine were grown from aqueous solutions by means of the low cooling method. On the samples prepared from <110> pyramids we measured the main physical properties, in particular: spontaneous polarization Ps, values of coercive field Ec, internal electrical field Eb, dielectric permittivity εT, dielectric losses tanδ, domain structure and hysteresis loops. We found that the prepared Pt-doped crystals possess good and reproducible physical properties, structural homogeneity and low internal strain. The value of Eb, important for detector construction, can be adjusted by Pt(IV)-ion concentration in the growth solution. Based on these experimental results, a reproducible growth procedure operating at constant temperature and employing a special three-zone flow crystallizer was designed. The pyroelectric detectors prepared from these materials have been tested from the point of view of current-voltage response.
Keywords :
capacitance; crystal growth from solution; dielectric hysteresis; dielectric losses; dielectric polarisation; electric domains; infrared detectors; internal stresses; organic compounds; permittivity; platinum; pyroelectric detectors; L-alanine; Pt; Pt(IV) ions; aqueous solutions; coercive field; complex-forming ions; current-voltage relations; detector construction; dielectric losses; dielectric permittivity; dielectric polarization; domain structure; growth solution; hysteresis loops; internal electrical field; internal strain; low cooling method; physical properties; pyroelectric detectors; single crystals; structural homogeneity; three-zone flow crystallizer; triglycine sulfate; Cooling; Crystals; Detectors; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Electric variables measurement; Loss measurement; Particle measurements; Permittivity measurement;
Conference_Titel :
Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on
Print_ISBN :
0-7803-8348-6
DOI :
10.1109/ICSD.2004.1350550