Title :
An application of data warehouse technology to the measurement system for UML based artifacts
Author :
Fujii, Taku ; Kambayashi, Yahiko
fDate :
6/23/1905 12:00:00 AM
Abstract :
A novel system, Project Data Warehouse, for the measurement of changes in development artifacts based on data warehouse technology is reported. The new system is based on an architecture that is extendable to store various kinds of UML based development artifacts and flexible to apply the various types of measurements to quantify the changes in those artifacts. Also, it provides multi-dimensional analysis of the measurement results. An application result of Project Data Warehouse to the development artifacts of a commercial development project is also reported
Keywords :
data warehouses; object-oriented programming; software architecture; software metrics; specification languages; Project Data Warehouse; UML based artifacts; UML based development artifacts; commercial development project; data warehouse technology; development artifact change measurement; measurement system; multi-dimensional analysis; Application software; Chromium; Computer architecture; Data warehouses; Productivity; Programming; Project management; Risk management; Software engineering; Unified modeling language;
Conference_Titel :
Computer Software and Applications Conference, 2001. COMPSAC 2001. 25th Annual International
Conference_Location :
Chicago, IL
Print_ISBN :
0-7695-1372-7
DOI :
10.1109/CMPSAC.2001.960653
