An application of data warehouse technology to the measurement system for UML based artifacts

Author

Fujii, Taku ; Kambayashi, Yahiko

fYear

2001

fDate

6/23/1905 12:00:00 AM

Firstpage

459

Lastpage

467

Abstract

A novel system, Project Data Warehouse, for the measurement of changes in development artifacts based on data warehouse technology is reported. The new system is based on an architecture that is extendable to store various kinds of UML based development artifacts and flexible to apply the various types of measurements to quantify the changes in those artifacts. Also, it provides multi-dimensional analysis of the measurement results. An application result of Project Data Warehouse to the development artifacts of a commercial development project is also reported

Keywords

data warehouses; object-oriented programming; software architecture; software metrics; specification languages; Project Data Warehouse; UML based artifacts; UML based development artifacts; commercial development project; data warehouse technology; development artifact change measurement; measurement system; multi-dimensional analysis; Application software; Chromium; Computer architecture; Data warehouses; Productivity; Programming; Project management; Risk management; Software engineering; Unified modeling language;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Software and Applications Conference, 2001. COMPSAC 2001. 25th Annual International

Conference_Location

Chicago, IL

ISSN

0730-3157

Print_ISBN

0-7695-1372-7

Type

conf

DOI

10.1109/CMPSAC.2001.960653

Filename

960653