Title :
Normally-Off SiC VJFETs for 800 V and 1200 V Power Switching Applications
Author :
Sankin, I. ; Sheridan, D.C. ; Draper, W. ; Bondarenko, V. ; Kelley, R. ; Mazzola, M.S. ; Casady, J.B.
Author_Institution :
SemiSouth Labs., Inc., Starkville, MS
Abstract :
This paper reports on the development of a normally- off 4H-SiC VJFET power switch technology suitable for drop in replacement in switching-mode power supplies (SMPS). The fabricated devices exhibited a low specific on-resistance (Ron-sp) measured at VDS=1 V and VGs=2-5 V. The transistors designed for 800 V applications had RON-SP < 2.9 mOmegaldrcm2 and RON-SP < 6.6 mOmegaldrcm2 at 25degC and 200degC, respectively. The devices designed for 1200 V application had RON-SP < 4.3 mOmegaldrcm2 at 25degC and RON-SP < 12.8 mOmegaldrcm2 at 200degC. The total delay time of 73 ns was measured on a 1200 V device when switching from 600 V to 4.9 A with the gate bias ranging from 0 V to 2.75 V. The highest measured off-state drain voltage blocked by a 1200 V device at VGS=0 V exceeded 1800 V with the total drain leakage of 1 mA.
Keywords :
III-V semiconductors; junction gate field effect transistors; power field effect transistors; silicon compounds; switched mode power supplies; current 1 mA; current 4.9 A; gate bias; normally-off SiC VJFET; off-state drain voltage; power switching applications; switching-mode power supplies; temperature 200 degC; temperature 25 degC; voltage 1 V; voltage 1200 V; voltage 2.5 V; voltage 600 V; voltage 800 V; Application specific integrated circuits; Bonding; Delay; Power semiconductor devices; Power semiconductor switches; Silicon carbide; Switched-mode power supply; Temperature; Threshold voltage; Time measurement;
Conference_Titel :
Power Semiconductor Devices and IC's, 2008. ISPSD '08. 20th International Symposium on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1532-8
Electronic_ISBN :
978-1-4244-1533-5
DOI :
10.1109/ISPSD.2008.4538948