• DocumentCode
    1727747
  • Title

    An effective modeling method for multi-scale and multilayered power/ground plane structures

  • Author

    Choi, Jae Young ; Swaminathan, Madhavan

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2011
  • Firstpage
    477
  • Lastpage
    483
  • Abstract
    As more packages or chips are integrated into a single system in recent electronic designs, power/ground planes tend to contain numerous and diverse features than ever, such as via holes, small apertures, plane gaps, etc. Although dimensions of these features are usually very small compared to the power/ground planes, their influence on the power delivery network cannot be neglected. However, power/ground plane analysis methods using square or rectangular meshes, such as multilayer-finite difference method, can generate large number of unit cells for small features in a large design. Multi-scale structures can be effectively meshed by using triangular mesh scheme, which can then be solved using finite element method (FEM). However, it is difficult to include external circuit elements to FEM, since the equivalent circuit model of FEM is not physically intuitive. In this article, a new modeling method, multilayer triangle element method, which is efficient for solving multi-scale and multilayer power/ground plane structures with external circuit elements, is presented.
  • Keywords
    electronics packaging; equivalent circuits; finite difference methods; finite element analysis; electronic designs; equivalent circuit; finite element method; multilayer finite difference method; multilayered power/ground plane structures; multiscale structures; packages; plane gaps; power delivery network; triangle element method; triangular mesh scheme; via holes; Admittance; Apertures; Equations; Equivalent circuits; Finite element methods; Integrated circuit modeling; Mathematical model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898554
  • Filename
    5898554