Title :
The Feasibility of Automated Feedback-Directed Specification-Based Test Generation: A Case Study of a High-Assurance Operating System
Author :
Weber, Sam ; Paradkar, Amitkumar ; McIntosh, Suzanne K. ; Toll, David C. ; Karger, Paul A. ; Kaplan, Matthew ; Palmer, Elaine R.
Author_Institution :
Thomas J. Watson Res. Center, IBM Corp., Yorktown Heights, NY
Abstract :
In this paper, we describe results of a case study to establish the feasibility of deriving mappings between an abstract user level specification and the code elements in a concrete implementation of a highly secure smart card operating system. Such a mapping is necessary for feedback-directed specification-based test generation to improve code coverage, needed by the stringent criteria for high-assurance systems. We used test cases generated from the user level specification to identify the executed code elements and attempted to use static analysis to map the unexecuted code elements to the corresponding elements in the user level specification. Our primary result is evidence that, given a sufficiently expressive user level specification and a test generation system that is able to effectively use such a specification, the resulting tests will cover the vast majority of the code branches that are able to be covered. Therefore, the benefit of a feedback-directed system will be limited. We further provide evidence that the static analysis required to generate feedback in these cases tends to be difficult, involving inferring the semantics of the internal implementation of data structures. In particular, we observed that the internal states at the implementation level in a high security application pose significant challenges to this mapping process.
Keywords :
formal specification; operating systems (computers); program diagnostics; program testing; security of data; smart cards; abstract user level specification; automated feedback-directed specification-based test generation; high-assurance operating system; smart card operating system; static analysis; Automatic testing; Concrete; Information security; Operating systems; Reliability engineering; Smart cards; Software reliability; Software testing; System testing; Unified modeling language;
Conference_Titel :
Software Reliability Engineering, 2008. ISSRE 2008. 19th International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-0-7695-3405-3
Electronic_ISBN :
1071-9458
DOI :
10.1109/ISSRE.2008.33